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MemTest86 executes a series of numbered test sections to check for errors. These test sections consist of a combination of test algorithm, data pattern and cache setting. The execution order for these tests were arranged so that errors will be detected as rapidly as possible. All tests performed and testing results are listed below:
Test 0 - Address test, walking ones, no cache: Pass
Test 1 - Address test, own address, Sequential:Pass
Test 2 - Address test, own address, Parallel:Pass
Test 3 - Moving inversions, ones&zeros, Parallel:Pass
Test 4 - Moving inversions, 8 bit pattern:Pass
Test 5 - Moving inversions, random pattern:Pass
Test 6 - Block move, 64 moves:Pass
Test 7 - Moving inversions, 32 bit pattern:Pass
Test 8 - Random number sequence:Pass
Test 9 - Modulo 20, Random pattern:Pass
Test 10 - Bit fade test, 2 patterns:Pass
Test 11 - Random number sequence, 64-bit:Pass
Test 12 - Random number sequence, 128-bit:Pass
Test 13 - Hammer Test:Pass
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All key functions of the device have been tested, R2/Ready for resale.
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